Some mathematical analysis in semiconductor devices

Statistical Analysis of Semiconductor Devices

Analysis of Fluctuations in Semiconductor Devices

Title of dissertation: ANALYSIS OF FLUCTUATIONS IN SEMICONDUCTOR DEVICES Petru Andrei, Doctor of Philosophy, 2004 Dissertation directed by: Professor Isaak D. Mayergoyz Department of Electrical and Computer Engineering The random nature of ion implantation and diffusion processes as well as inevitable tolerances in fabrication result in random fluctuations of doping concentrations and oxide thi...

cohesion and cohesive devices in a contrastive analysis between ge and esp texts

the present study was an attempt to conduct a contrastive analysis between general english (ge) and english for specific purposes (esp) texts in terms of cohesion and cohesive devices. to this end, thirty texts from different esp and ge textbooks were randomly selected. then they were analyzed manually to find the frequency of cohesive devices. cohesive devices include reference, substitution, ...

Failure Analysis System for Submicron Semiconductor Devices

OVERVIEW: Failure analysis of semiconductor device is becoming increasingly difficult as VLSI technology evolves toward smaller features and semiconductor device structures become more complex. Especially considering that the defective area obtained through diagnosis pin-pointing faulty sites is not the same size as the area subjected to physical analysis, and this disparity becomes more pronou...

Noise in Semiconductor Devices

Noise (a spontaneous fluctuation in current or in voltage) is generated in all semiconductor devices. The intensity of these fluctuations depends on device type, its manufacturing process, and operating conditions. The resulted noise, as a superposition of different noise sources, is defined as an inherent noise. The equivalent noise models (containing all noise sources) are created for a parti...